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“EVOLUTION OF SURFACE MORPHOLOGY AND VARIATION OF ROUGHNESS IN THIN FILMS (BASED ON AFM ANALYSIS)”

Authors

  • Numonjonova Gulxayo Ismoiljon qizi

    Andijan state university Student of the Faculty of Physics, Mathematics and IT
    Author
  • Doniyorbekova Gulxayo Doniyorbek qizi

    Author

Keywords:

ZnO thin film, S-doped ZnO, atomic force microscopy, AFM, surface morphology, surface roughness, nanostructure, granular structure, growth mechanism.

Abstract

This article analyzes the surface morphology and roughness properties of pure ZnO and sulfur-doped ZnO thin films using atomic force microscopy (AFM). During the study, the samples were examined over a scanning area of 500 nm × 500 nm, and the effect of sulfur doping on the formation of the film surface was evaluated. The obtained 2D AFM images revealed significant morphological differences between the pure ZnO and S-doped ZnO thin films. The pure ZnO thin film was characterized by a relatively smooth, homogeneous, and low-roughness surface. This morphology indicates that the particles were arranged in a more ordered manner during film formation and that fewer surface irregularities were formed. In contrast, the S-doped ZnO thin film exhibited a rougher and more granular surface structure. AFM images showed an increased granular morphology, dense distribution of nanosized particles, and the formation of unevenly distributed peaks and valleys. These changes suggest that the incorporation of sulfur atoms into the ZnO structure affects the film growth mechanism, crystallization process, and surface energy distribution. The results demonstrate that sulfur doping is an effective approach for modifying the surface morphology of ZnO thin films and improving their potential functional properties for sensing, photocatalytic, and optoelectronic applications.

References

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Published

2026-05-28